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Density and well width dependences of the effective mass of twodimensional holes in (100) GaAs quantum wells measured by cyclotron resonance at microwave frequencies

机译:有效质量的密度和井宽依赖性   通过回旋加速器测量的(100)Gaas量子阱中的二维空穴   微波频率的共振

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摘要

Cyclotron resonance at microwave frequencies is used to measure the band mass(m_b) of the two-dimensional holes (2DH's) in carbon-doped (100)GaAs/AlxGa1-xAs heterostructures. The measured m_b shows strong dependences onboth the 2DH density(p) and the GaAs quantum well width (W). For a fixed W, inthe density range (0.4x10^11 to 1.1x10^11 cm^-2) studied here, m_b increaseswith p, consistent with previous studies of the 2DHs on the (311)A surface. Fora fixed p = 1.1x10^11 cm^-2, mb increases from 0.22 m_e at W = 10 nm to 0.50m_e at W = 30 nm, and saturates around 0.51 m_e for W > 30 nm.
机译:微波频率下的回旋共振用于测量碳掺杂(100)GaAs / AlxGa1-xAs异质结构中二维空穴(2DH's)的能带质量(m_b)。测得的m_b显示出对2DH密度(p)和GaAs量子阱宽度(W)的强烈依赖性。对于固定的W,在这里研究的密度范围(0.4x10 ^ 11到1.1x10 ^ 11 cm ^ -2)中,m_b随着p的增加而增加,这与先前对(311)A表面2DH的研究一致。对于固定的p = 1.1x10 ^ 11 cm ^ -2,mb从W = 10 nm时的0.22 m_e增加到W = 30 nm时的0.50m_e,并且对于W> 30 nm,mb约为0.51 m_e。

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